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Products > Semiconductor Components > Ceramic Substrates for Probe Cards  Japanese

Ceramic Substrates for Probe Cards

Kyocera provides multilayer ceramic substrates, with single-layer or multilayer thin-film metallization, for DRAM, flash memory and logic device (multi-DUT) wafer probe cards.


DRAM: Dynamic Random-Access Memory; DUT: Device Under Test


image: Single-Layer Thin-Film Metallization on Multilayer Ceramic Substrate for 300mm DRAM Wafer Probe Card image: Single-Layer Thin-Film Metallization on Single-Layer Ceramic Substrate for 300mm Flash Memory Wafer Probe Card
Single-Layer Thin-Film Metallization on
Multilayer Ceramic Substrate for
300mm DRAM Wafer Probe Card		 Single-Layer Thin-Film Metallization on
Single-Layer Ceramic Substrate for
300mm Flash Memory Wafer Probe Card
     
image: Multilayer Thin-Film Metallization on Multilayer Ceramic Substrate (59mmSQ) for Logic Device (4-DUT) Wafer Probe Card  
Multilayer Thin-Film Metallization on
Multilayer Ceramic Substrate (59mmSQ) for
Logic Device (4-DUT) Wafer Probe Card		  

 Multilayer Ceramic Substrate + Single-Layer Thin-Film Metallization
Multilayer Ceramic Substrate + Single Layer Thin Film Metallization

 Multilayer Ceramic Substrate + Multilayer Thin-Film Metallization
Multilayer Ceramic Substrate + Multilayer Thin-Film Metallization

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