Kyocera provides multilayer ceramic substrates, with single-layer or multilayer thin-film metallization, for DRAM, flash memory and logic device (multi-DUT) wafer probe cards.
DRAM: Dynamic Random-Access Memory
DUT: Device Under Test
Single-Layer Thin-Film Metallization on
Multilayer Ceramic Substrate for
300mm DRAM Wafer Probe Card
Single-Layer Thin-Film Metallization on
Single-Layer Ceramic Substrate for
300mm Flash Memory Wafer Probe Card
Multilayer Thin-Film Metallization on
Multilayer Ceramic Substrate (59mmSQ) for
Logic Device (4-DUT) Wafer Probe Card